Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...

Scientists from China have developed a new deep-learning method for detecting defects in PV cells. Analyzing electroluminescence (EL) images, the novel system utilizes the YOLOv8 convolutional neural ...

Using a novel technique for defect detection, researchers from EPFL have settled a long-running dispute over laser additive manufacturing procedures. A graphic representation of the experimental setup ...

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...